4th International Trade Compliance

Date: 08-Apr-14 to 10-Apr-14
Location: Chicago Crowne Plaza / Chicago / Illinois / United States
Category: Politics Shipping, Storage & Logistics Legal Services Conferences & Trade Fairs International Organizations

Due to the overwhelming complexities and constantly changing
global trade requirements, it is crucial for organizations to effectively manage trade procedures throughout all departments.

The marcus evans 4th Annual International Trade Compliance
Conference will address advanced strategies in structuring a
multinational trade compliance group to remain competitive in the
global market place. Attendees will gain a thorough understanding of the recent changes in the Export Control Reform Initiative as well as the latest on Customs-Trade Partnership Against Terrorism (C-TPAT) requirements and recent trends with the CBP.

Visitors

marcus evans invites C-Level Executives, Vice-Presidents,
Directors, General Counsel, Associate General Counsel, Senior
Counsel and In-House Counsel with responsibilities in the following
areas:
• Global/International Trade Compliance
• Import/Export Trade Compliance
• Global Customs Compliance
• Import/Export Operations
• Export Controls Compliance
• Licensing

Exhibitors

Trade Consultants specializing in:
• International / Global Trade Compliance Processes
• Customs Compliance
• Import compliance
• Export controls compliance
• Logistics
• Supply Chain Management & Security
• Free Trade Agreements
• Trade Compliance training providers

Law Firms specializing in:
• International Trade Compliance
• Import Compliance
• Customs Compliance
• Export Control Compliance
• Sanctions & Embargoes
• Voluntary Disclosure

Software / Solutions Providers specializing in:
• Automation of import and export compliance processes
• Shipping solutions
• End user screening
• Supply Chain Management and security

Go to event website

EIN News provides powerful, real-time media monitoring, news aggregation & syndication services. Read the latest news about this topic. See: